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Addressing the Impact of Surface Roughness on Epsilon-Near-Zero Silicon Carbide Substrates
[Image: see text] Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss an...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10515697/ https://www.ncbi.nlm.nih.gov/pubmed/37743935 http://dx.doi.org/10.1021/acsphotonics.3c00476 |