SEM3De: image restoration for FIB-SEM

MOTIVATION: FIB-SEM (Focused Ion Beam—Scanning Electron Microscopy) is a technique to generate 3D images of samples up to several microns in depth. The principle is based on the alternate use of SEM to image the surface of the sample (a few nanometers thickness) and of FIB to mill the surface of the...

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Detalles Bibliográficos
Autores principales: Serir, Rayane Hamdane, Deliot, Aurelie, Kizilyaprak, Caroline, Daraspe, Jean, Walczak, Christine, Canini, Françoise, Leleu, Amandine, Marco, Sergio, Ronzon, Frederic, Messaoudi, Cedric
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2023
Materias:
Application Note
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10516526/
https://www.ncbi.nlm.nih.gov/pubmed/37745005
http://dx.doi.org/10.1093/bioadv/vbad119

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10516526/
https://www.ncbi.nlm.nih.gov/pubmed/37745005
http://dx.doi.org/10.1093/bioadv/vbad119

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