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SEM3De: image restoration for FIB-SEM
MOTIVATION: FIB-SEM (Focused Ion Beam—Scanning Electron Microscopy) is a technique to generate 3D images of samples up to several microns in depth. The principle is based on the alternate use of SEM to image the surface of the sample (a few nanometers thickness) and of FIB to mill the surface of the...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Oxford University Press
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10516526/ https://www.ncbi.nlm.nih.gov/pubmed/37745005 http://dx.doi.org/10.1093/bioadv/vbad119 |