Strain-induced degradation and recovery of flexible NbO(x)-based threshold switching device

We investigate the functionality of NbO(x)-based selector devices on a flexible substrate. It was observed that the failure mechanism of cyclic tensile strain is from the disruption of atom arrangements, which essentially led to the crack formation of the film. When under cyclic compressive strain,...

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Detalles Bibliográficos
Autores principales: Ang, Jia Min, Dananjaya, Putu Andhita, Ang, Calvin Ching Ian, Lim, Gerard Joseph, Lew, Wen Siang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10519953/
https://www.ncbi.nlm.nih.gov/pubmed/37749156
http://dx.doi.org/10.1038/s41598-023-43192-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10519953/
https://www.ncbi.nlm.nih.gov/pubmed/37749156
http://dx.doi.org/10.1038/s41598-023-43192-w

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