Fault Diagnosis in Analog Circuits Using Swarm Intelligence

Open or short-circuit faults, as well as discrete parameter faults, are the most commonly used models in the simulation prior to testing methodology. However, since analog circuits exhibit continuous responses to input signals, faults in specific circuit elements may not fully capture all potential...

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Detalles Bibliográficos
Autores principales: Nedjah, Nadia, Galindo, Jalber Dinelli Luna, Mourelle, Luiza de Macedo, de Oliveira, Fernanda Duarte Vilela Reis
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10526784/
https://www.ncbi.nlm.nih.gov/pubmed/37754139
http://dx.doi.org/10.3390/biomimetics8050388

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10526784/
https://www.ncbi.nlm.nih.gov/pubmed/37754139
http://dx.doi.org/10.3390/biomimetics8050388

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