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Fault Diagnosis in Analog Circuits Using Swarm Intelligence
Open or short-circuit faults, as well as discrete parameter faults, are the most commonly used models in the simulation prior to testing methodology. However, since analog circuits exhibit continuous responses to input signals, faults in specific circuit elements may not fully capture all potential...
Autores principales: | Nedjah, Nadia, Galindo, Jalber Dinelli Luna, Mourelle, Luiza de Macedo, de Oliveira, Fernanda Duarte Vilela Reis |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10526784/ https://www.ncbi.nlm.nih.gov/pubmed/37754139 http://dx.doi.org/10.3390/biomimetics8050388 |
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