ESD Research of SCR Devices under Harsh Environments

In prior technology, system-level electrostatic discharge (ESD) tests under environment change conditions mainly focused on testing the effect of a high-temperature environment. i.e., the effect on internal circuits of heat generated outside. However, few studies have explored the effect of ambient...

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Detalles Bibliográficos
Autores principales: Lin, Chien-Chun, Lin, Chun-Yu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532737/
https://www.ncbi.nlm.nih.gov/pubmed/37763460
http://dx.doi.org/10.3390/ma16186182

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532737/
https://www.ncbi.nlm.nih.gov/pubmed/37763460
http://dx.doi.org/10.3390/ma16186182

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