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ESD Research of SCR Devices under Harsh Environments
In prior technology, system-level electrostatic discharge (ESD) tests under environment change conditions mainly focused on testing the effect of a high-temperature environment. i.e., the effect on internal circuits of heat generated outside. However, few studies have explored the effect of ambient...
Autores principales: | Lin, Chien-Chun, Lin, Chun-Yu |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532737/ https://www.ncbi.nlm.nih.gov/pubmed/37763460 http://dx.doi.org/10.3390/ma16186182 |
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