Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers

Two combined ellipsometric techniques—variable angle spectroscopic ellipsometry (VASE) and variable temperature spectroscopic ellipsometry (VTSE)—were used as tools to study the surface order and dielectric properties of thin films of a poly(3-hexylthiophene-2,5-diyl) (P3HT) mixture with a fullerene...

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Detalles Bibliográficos
Autores principales: Hajduk, Barbara, Jarka, Paweł, Bednarski, Henryk, Tański, Tomasz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10535426/
https://www.ncbi.nlm.nih.gov/pubmed/37765605
http://dx.doi.org/10.3390/polym15183752

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10535426/
https://www.ncbi.nlm.nih.gov/pubmed/37765605
http://dx.doi.org/10.3390/polym15183752

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