A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography

PURPOSE: This pilot study was conducted to evaluate half-value layer (HVL) measurements obtained using a semiconductor dosimeter for intraoral radiography. MATERIALS AND METHODS: This study included 8 aluminum plates, 4 of which were low-purity (less than 99.9%) and 4 high-purity (greater than 99.9%...

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Detalles Bibliográficos
Autores principales: Nouchi, Shun, Yoshida, Hidenori, Miki, Yusaku, Tezuka, Yasuhito, Ogawa, Ruri, Ogura, Ichiro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Korean Academy of Oral and Maxillofacial Radiology 2023
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10548152/
https://www.ncbi.nlm.nih.gov/pubmed/37799740
http://dx.doi.org/10.5624/isd.20230039

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10548152/
https://www.ncbi.nlm.nih.gov/pubmed/37799740
http://dx.doi.org/10.5624/isd.20230039

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