Direct characterization of intrinsic defects in monolayer ReSe(2) on graphene

Understanding the characteristics of intrinsic defects in crystals is of great interest in many fields, from fundamental physics to applied materials science. Combined investigations of scanning tunneling microscopy/spectroscopy (STM/S) and density functional theory (DFT) are conducted to understand...

Descripción completa

Detalles Bibliográficos
Autores principales: Lam, Nguyen Huu, Ko, Jae-Hyeok, Choi, Byoung Ki, Ly, Trinh Thi, Lee, Giyeok, Jang, Kyuha, Chang, Young Jun, Soon, Aloysius, Kim, Jungdae
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2023
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10563845/
https://www.ncbi.nlm.nih.gov/pubmed/37822900
http://dx.doi.org/10.1039/d3na00363a

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10563845/
https://www.ncbi.nlm.nih.gov/pubmed/37822900
http://dx.doi.org/10.1039/d3na00363a

Ejemplares similares