Large-Area Mapping of Voids and Dislocations in Basal-Faceted Sapphire Ribbons by Synchrotron Radiation Imaging

The understanding of structural defects in basal-faceted sapphire ribbons was improved through X-ray imaging at a synchrotron source. The combination of phase contrast and X-ray diffraction makes it possible to visualize and characterize both gas voids and dislocations in the bulk of the ribbons gro...

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Detalles Bibliográficos
Autores principales: Argunova, Tatiana S., Kohn, Victor G., Lim, Jae-Hong, Krymov, Vladimir M., Gutkin, Mikhail Yu.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10574538/
https://www.ncbi.nlm.nih.gov/pubmed/37834726
http://dx.doi.org/10.3390/ma16196589

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10574538/
https://www.ncbi.nlm.nih.gov/pubmed/37834726
http://dx.doi.org/10.3390/ma16196589

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