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Large-Area Mapping of Voids and Dislocations in Basal-Faceted Sapphire Ribbons by Synchrotron Radiation Imaging
The understanding of structural defects in basal-faceted sapphire ribbons was improved through X-ray imaging at a synchrotron source. The combination of phase contrast and X-ray diffraction makes it possible to visualize and characterize both gas voids and dislocations in the bulk of the ribbons gro...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10574538/ https://www.ncbi.nlm.nih.gov/pubmed/37834726 http://dx.doi.org/10.3390/ma16196589 |