Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, b...

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Detalles Bibliográficos
Autores principales: Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Sungwook, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorkhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergbäck, Kuschel, Stephan, Lee, Hae Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pablo Pedro, Ricardo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, Eggert, Jon H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10579415/
https://www.ncbi.nlm.nih.gov/pubmed/37845245
http://dx.doi.org/10.1038/s41598-023-35526-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10579415/
https://www.ncbi.nlm.nih.gov/pubmed/37845245
http://dx.doi.org/10.1038/s41598-023-35526-5

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