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Quantifying Nanoparticle Layer Topography: Theoretical Modeling and Atomic Force Microscopy Investigations

[Image: see text] A comprehensive method consisting of theoretical modeling and experimental atomic force microscopy (AFM) measurements was developed for the quantitative analysis of nanoparticle layer topography. Analytical results were derived for particles of various shapes such as cylinders (rod...

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Detalles Bibliográficos
Autores principales: Adamczyk, Zbigniew, Sadowska, Marta, Nattich-Rak, Małgorzata
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10601541/
https://www.ncbi.nlm.nih.gov/pubmed/37824293
http://dx.doi.org/10.1021/acs.langmuir.3c02024