Rapid Identification of Material Defects Based on Pulsed Multifrequency Eddy Current Testing and the k-Nearest Neighbor Method

The article discusses the utilization of Pulsed Multifrequency Excitation and Spectrogram Eddy Current Testing (PMFES-ECT) in conjunction with the supervised learning method for the purpose of estimating defect parameters in conductive materials. To obtain estimates for these parameters, a three-dim...

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Detalles Bibliográficos
Autores principales: Grochowalski, Jacek M., Chady, Tomasz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608068/
https://www.ncbi.nlm.nih.gov/pubmed/37895631
http://dx.doi.org/10.3390/ma16206650

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608068/
https://www.ncbi.nlm.nih.gov/pubmed/37895631
http://dx.doi.org/10.3390/ma16206650

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