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Rapid Identification of Material Defects Based on Pulsed Multifrequency Eddy Current Testing and the k-Nearest Neighbor Method
The article discusses the utilization of Pulsed Multifrequency Excitation and Spectrogram Eddy Current Testing (PMFES-ECT) in conjunction with the supervised learning method for the purpose of estimating defect parameters in conductive materials. To obtain estimates for these parameters, a three-dim...
Autores principales: | Grochowalski, Jacek M., Chady, Tomasz |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608068/ https://www.ncbi.nlm.nih.gov/pubmed/37895631 http://dx.doi.org/10.3390/ma16206650 |
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