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Vertical GaN MOSFET Power Devices
Gallium nitride (GaN) possesses remarkable characteristics such as a wide bandgap, high critical electric field, robust antiradiation properties, and a high saturation velocity for high-power devices. These attributes position GaN as a pivotal material for the development of power devices. Among the...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10609112/ https://www.ncbi.nlm.nih.gov/pubmed/37893374 http://dx.doi.org/10.3390/mi14101937 |
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author | Langpoklakpam, Catherine Liu, An-Chen Hsiao, Yi-Kai Lin, Chun-Hsiung Kuo, Hao-Chung |
author_facet | Langpoklakpam, Catherine Liu, An-Chen Hsiao, Yi-Kai Lin, Chun-Hsiung Kuo, Hao-Chung |
author_sort | Langpoklakpam, Catherine |
collection | PubMed |
description | Gallium nitride (GaN) possesses remarkable characteristics such as a wide bandgap, high critical electric field, robust antiradiation properties, and a high saturation velocity for high-power devices. These attributes position GaN as a pivotal material for the development of power devices. Among the various GaN-based devices, vertical GaN MOSFETs stand out for their numerous advantages over their silicon MOSFET counterparts. These advantages encompass high-power device applications. This review provides a concise overview of their significance and explores their distinctive architectures. Additionally, it delves into the advantages of vertical GaN MOSFETs and highlights their recent advancements. In conclusion, the review addresses methods to enhance the breakdown voltage of vertical GaN devices. This comprehensive perspective underscores the pivotal role of vertical GaN MOSFETs in the realm of power electronics and their continual progress. |
format | Online Article Text |
id | pubmed-10609112 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-106091122023-10-28 Vertical GaN MOSFET Power Devices Langpoklakpam, Catherine Liu, An-Chen Hsiao, Yi-Kai Lin, Chun-Hsiung Kuo, Hao-Chung Micromachines (Basel) Review Gallium nitride (GaN) possesses remarkable characteristics such as a wide bandgap, high critical electric field, robust antiradiation properties, and a high saturation velocity for high-power devices. These attributes position GaN as a pivotal material for the development of power devices. Among the various GaN-based devices, vertical GaN MOSFETs stand out for their numerous advantages over their silicon MOSFET counterparts. These advantages encompass high-power device applications. This review provides a concise overview of their significance and explores their distinctive architectures. Additionally, it delves into the advantages of vertical GaN MOSFETs and highlights their recent advancements. In conclusion, the review addresses methods to enhance the breakdown voltage of vertical GaN devices. This comprehensive perspective underscores the pivotal role of vertical GaN MOSFETs in the realm of power electronics and their continual progress. MDPI 2023-10-16 /pmc/articles/PMC10609112/ /pubmed/37893374 http://dx.doi.org/10.3390/mi14101937 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Review Langpoklakpam, Catherine Liu, An-Chen Hsiao, Yi-Kai Lin, Chun-Hsiung Kuo, Hao-Chung Vertical GaN MOSFET Power Devices |
title | Vertical GaN MOSFET Power Devices |
title_full | Vertical GaN MOSFET Power Devices |
title_fullStr | Vertical GaN MOSFET Power Devices |
title_full_unstemmed | Vertical GaN MOSFET Power Devices |
title_short | Vertical GaN MOSFET Power Devices |
title_sort | vertical gan mosfet power devices |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10609112/ https://www.ncbi.nlm.nih.gov/pubmed/37893374 http://dx.doi.org/10.3390/mi14101937 |
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