Online dynamic flat-field correction for MHz microscopy data at European XFEL

The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolut...

Descripción completa

Detalles Bibliográficos
Autores principales: Birnsteinova, Sarlota, Ferreira de Lima, Danilo E., Sobolev, Egor, Kirkwood, Henry J., Bellucci, Valerio, Bean, Richard J., Kim, Chan, Koliyadu, Jayanath C. P., Sato, Tokushi, Dall’Antonia, Fabio, Asimakopoulou, Eleni Myrto, Yao, Zisheng, Buakor, Khachiwan, Zhang, Yuhe, Meents, Alke, Chapman, Henry N., Mancuso, Adrian P., Villanueva-Perez, Pablo, Vagovič, Patrik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2023
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10624028/
https://www.ncbi.nlm.nih.gov/pubmed/37729072
http://dx.doi.org/10.1107/S1600577523007336

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10624028/
https://www.ncbi.nlm.nih.gov/pubmed/37729072
http://dx.doi.org/10.1107/S1600577523007336

Ejemplares similares