Identifying and fixing in-plane positioning and stability issues on a microscope using machine-readable patterned position scales

Investigations of the in-plane positioning capabilities of microscopes using machine-readable encoded patterned scales are presented. The scales have patterns that contain absolute position information, and adequate software accurately determines the in-plane position from the scale images captured...

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Detalles Bibliográficos
Autores principales: Acher, Olivier, de Abreu, Matheus Belisario, Grigoriev, Alexander, de Bettignies, Philippe, Vilotta, Maxime, Nguyên, Thanh-Liêm
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10636118/
https://www.ncbi.nlm.nih.gov/pubmed/37945927
http://dx.doi.org/10.1038/s41598-023-46950-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10636118/
https://www.ncbi.nlm.nih.gov/pubmed/37945927
http://dx.doi.org/10.1038/s41598-023-46950-y

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