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Identifying and fixing in-plane positioning and stability issues on a microscope using machine-readable patterned position scales
Investigations of the in-plane positioning capabilities of microscopes using machine-readable encoded patterned scales are presented. The scales have patterns that contain absolute position information, and adequate software accurately determines the in-plane position from the scale images captured...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10636118/ https://www.ncbi.nlm.nih.gov/pubmed/37945927 http://dx.doi.org/10.1038/s41598-023-46950-y |