Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry

PURPOSE: To evaluate the errors caused by metal implants and metal artifacts in the two‐dimensional entrance fluences reconstructed using the back‐projection algorithm based on electronic portal imaging device (EPID) images. METHODS: The EPID in the Varian VitalBeam accelerator was used to acquire p...

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Detalles Bibliográficos
Autores principales: Cao, Zheng, Gao, Xiang, Liu, Gongfa, Pei, Yuanji
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Radiation Oncology Physics
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10647983/
https://www.ncbi.nlm.nih.gov/pubmed/37573570
http://dx.doi.org/10.1002/acm2.14115

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10647983/
https://www.ncbi.nlm.nih.gov/pubmed/37573570
http://dx.doi.org/10.1002/acm2.14115

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