Cargando…

Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry

PURPOSE: To evaluate the errors caused by metal implants and metal artifacts in the two‐dimensional entrance fluences reconstructed using the back‐projection algorithm based on electronic portal imaging device (EPID) images. METHODS: The EPID in the Varian VitalBeam accelerator was used to acquire p...

Descripción completa

Detalles Bibliográficos
Autores principales: Cao, Zheng, Gao, Xiang, Liu, Gongfa, Pei, Yuanji
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10647983/
https://www.ncbi.nlm.nih.gov/pubmed/37573570
http://dx.doi.org/10.1002/acm2.14115
_version_ 1785135232547028992
author Cao, Zheng
Gao, Xiang
Liu, Gongfa
Pei, Yuanji
author_facet Cao, Zheng
Gao, Xiang
Liu, Gongfa
Pei, Yuanji
author_sort Cao, Zheng
collection PubMed
description PURPOSE: To evaluate the errors caused by metal implants and metal artifacts in the two‐dimensional entrance fluences reconstructed using the back‐projection algorithm based on electronic portal imaging device (EPID) images. METHODS: The EPID in the Varian VitalBeam accelerator was used to acquire portal dose images (PDIs), and then commercial EPID dosimetry software was employed to reconstruct the two‐dimensional entrance fluences based on computed tomography (CT) images of the head phantoms containing interchangeable metal‐free/titanium/aluminum round bars. The metal‐induced errors in the two‐dimensional entrance fluences were evaluated by comparing the γ results and the pixel value errors in the metal‐affected regions. We obtained metal‐artifact‐free CT images by replacing the voxel values of non‐metal inserts with those of metal inserts in metal‐free CT images to evaluate the metal‐artifact‐induced errors. RESULTS: The γ passing rates (versus PDIs obtained without a phantom in the beam field (PDI(air)), 2%/2 mm) for the back‐projected two‐dimensional entrance fluences of phantoms containing titanium or aluminum (BP(Ti)/BP(Al)) were reduced from 92.4% to 90.5% and 90.6%, respectively, relative to the metal‐free phantom (BP(metal‐free)). Titanium causes more severe metal artifacts in CT images than aluminum, and its removal resulted in a 0.0022 CU (median) reduction in the pixel value of BP(Ti artifact‐free) relative to BP(Ti) in the metal‐affected region. Moreover, the mean absolute error (MAE) and root mean square error (RMSE) decreased from 0.0050 CU and 0.0063 CU to 0.0034 CU and 0.0040 CU, respectively (vs. BP(metal‐free)). CONCLUSION: Metal implants increase the errors in back‐projected two‐dimensional entrance fluences, and metals with higher electron densities cause more errors. For high‐electron‐density metal implants that produce severe metal artifacts (e.g., titanium), removing metal artifacts from the CT images can improve the accuracy of the two‐dimensional entrance fluences reconstructed by back‐projection algorithms.
format Online
Article
Text
id pubmed-10647983
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher John Wiley and Sons Inc.
record_format MEDLINE/PubMed
spelling pubmed-106479832023-08-13 Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry Cao, Zheng Gao, Xiang Liu, Gongfa Pei, Yuanji J Appl Clin Med Phys Radiation Oncology Physics PURPOSE: To evaluate the errors caused by metal implants and metal artifacts in the two‐dimensional entrance fluences reconstructed using the back‐projection algorithm based on electronic portal imaging device (EPID) images. METHODS: The EPID in the Varian VitalBeam accelerator was used to acquire portal dose images (PDIs), and then commercial EPID dosimetry software was employed to reconstruct the two‐dimensional entrance fluences based on computed tomography (CT) images of the head phantoms containing interchangeable metal‐free/titanium/aluminum round bars. The metal‐induced errors in the two‐dimensional entrance fluences were evaluated by comparing the γ results and the pixel value errors in the metal‐affected regions. We obtained metal‐artifact‐free CT images by replacing the voxel values of non‐metal inserts with those of metal inserts in metal‐free CT images to evaluate the metal‐artifact‐induced errors. RESULTS: The γ passing rates (versus PDIs obtained without a phantom in the beam field (PDI(air)), 2%/2 mm) for the back‐projected two‐dimensional entrance fluences of phantoms containing titanium or aluminum (BP(Ti)/BP(Al)) were reduced from 92.4% to 90.5% and 90.6%, respectively, relative to the metal‐free phantom (BP(metal‐free)). Titanium causes more severe metal artifacts in CT images than aluminum, and its removal resulted in a 0.0022 CU (median) reduction in the pixel value of BP(Ti artifact‐free) relative to BP(Ti) in the metal‐affected region. Moreover, the mean absolute error (MAE) and root mean square error (RMSE) decreased from 0.0050 CU and 0.0063 CU to 0.0034 CU and 0.0040 CU, respectively (vs. BP(metal‐free)). CONCLUSION: Metal implants increase the errors in back‐projected two‐dimensional entrance fluences, and metals with higher electron densities cause more errors. For high‐electron‐density metal implants that produce severe metal artifacts (e.g., titanium), removing metal artifacts from the CT images can improve the accuracy of the two‐dimensional entrance fluences reconstructed by back‐projection algorithms. John Wiley and Sons Inc. 2023-08-13 /pmc/articles/PMC10647983/ /pubmed/37573570 http://dx.doi.org/10.1002/acm2.14115 Text en © 2023 The Authors. Journal of Applied Clinical Medical Physics published by Wiley Periodicals, LLC on behalf of The American Association of Physicists in Medicine. https://creativecommons.org/licenses/by/4.0/This is an open access article under the terms of the http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Radiation Oncology Physics
Cao, Zheng
Gao, Xiang
Liu, Gongfa
Pei, Yuanji
Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title_full Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title_fullStr Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title_full_unstemmed Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title_short Effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by EPID dosimetry
title_sort effect of metal implants and metal artifacts on back‐projected two‐dimensional entrance fluence determined by epid dosimetry
topic Radiation Oncology Physics
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10647983/
https://www.ncbi.nlm.nih.gov/pubmed/37573570
http://dx.doi.org/10.1002/acm2.14115
work_keys_str_mv AT caozheng effectofmetalimplantsandmetalartifactsonbackprojectedtwodimensionalentrancefluencedeterminedbyepiddosimetry
AT gaoxiang effectofmetalimplantsandmetalartifactsonbackprojectedtwodimensionalentrancefluencedeterminedbyepiddosimetry
AT liugongfa effectofmetalimplantsandmetalartifactsonbackprojectedtwodimensionalentrancefluencedeterminedbyepiddosimetry
AT peiyuanji effectofmetalimplantsandmetalartifactsonbackprojectedtwodimensionalentrancefluencedeterminedbyepiddosimetry