Auxiliary Diagnostic Signal for Deep-Level Detection

We propose and demonstrate that temperature-dependent curve-fitting error values of the Schottky diode I–V curve in the forward regime can be an auxiliary diagnostic signal as the temperature-scan Capacitance DLTS (CDLTS) signals and helps to work time-efficiently with high accuracy when using the L...

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Detalles Bibliográficos
Autores principales: Ahn, Il-Ho, Lee, Dong Jin, Kim, Deuk Young
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10648165/
https://www.ncbi.nlm.nih.gov/pubmed/37947711
http://dx.doi.org/10.3390/nano13212866

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10648165/
https://www.ncbi.nlm.nih.gov/pubmed/37947711
http://dx.doi.org/10.3390/nano13212866

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