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A Phase Retrieval Method for 3D Shape Measurement of High-Reflectivity Surface Based on π Phase-Shifting Fringes
Fringe projection profilometry (FPP) has been widely used for 3D reconstruction, surface measurement, and reverse engineering. However, if the surface of an object has a high reflectivity, overexposure can easily occur. Image saturation caused by overexposure can lead to an incorrect intensity of th...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10648934/ https://www.ncbi.nlm.nih.gov/pubmed/37960546 http://dx.doi.org/10.3390/s23218848 |