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A Phase Retrieval Method for 3D Shape Measurement of High-Reflectivity Surface Based on π Phase-Shifting Fringes

Fringe projection profilometry (FPP) has been widely used for 3D reconstruction, surface measurement, and reverse engineering. However, if the surface of an object has a high reflectivity, overexposure can easily occur. Image saturation caused by overexposure can lead to an incorrect intensity of th...

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Detalles Bibliográficos
Autores principales:	Zhang, Yanjun, Sun, Junhua
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2023
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10648934/ https://www.ncbi.nlm.nih.gov/pubmed/37960546 http://dx.doi.org/10.3390/s23218848

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