Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing

Co(60)Fe(20)Sm(20) thin films were deposited onto glass substrates in a high vacuum setting. The films varied in thickness from 10 to 50 nm and underwent annealing processes at different temperatures: room temperature (RT), 100, 200, and 300 °C. Our analysis encompassed structural, magnetic, electri...

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Detalles Bibliográficos
Autores principales: Fern, Chi-Lon, Liu, Wen-Jen, Chang, Yung-Huang, Chiang, Chia-Chin, Chen, Yuan-Tsung, Lu, Pei-Xin, Su, Xuan-Ming, Lin, Shih-Hung, Lin, Ko-Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10649230/
https://www.ncbi.nlm.nih.gov/pubmed/37959587
http://dx.doi.org/10.3390/ma16216989

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10649230/
https://www.ncbi.nlm.nih.gov/pubmed/37959587
http://dx.doi.org/10.3390/ma16216989

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