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Deep learning-enhanced microscopy with extended depth-of-field
A computational imaging platform utilizing a physics-incorporated, deep-learned design of binary phase filter and a jointly optimized deconvolution neural network has been reported, achieving high-resolution, high-contrast imaging over extended depth ranges without the need for serial refocusing.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10667531/ https://www.ncbi.nlm.nih.gov/pubmed/37996459 http://dx.doi.org/10.1038/s41377-023-01323-y |