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Deep learning-enhanced microscopy with extended depth-of-field

A computational imaging platform utilizing a physics-incorporated, deep-learned design of binary phase filter and a jointly optimized deconvolution neural network has been reported, achieving high-resolution, high-contrast imaging over extended depth ranges without the need for serial refocusing.

Detalles Bibliográficos
Autor principal: Zhang, Yide
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10667531/
https://www.ncbi.nlm.nih.gov/pubmed/37996459
http://dx.doi.org/10.1038/s41377-023-01323-y
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author Zhang, Yide
author_facet Zhang, Yide
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description A computational imaging platform utilizing a physics-incorporated, deep-learned design of binary phase filter and a jointly optimized deconvolution neural network has been reported, achieving high-resolution, high-contrast imaging over extended depth ranges without the need for serial refocusing.
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spelling pubmed-106675312023-11-24 Deep learning-enhanced microscopy with extended depth-of-field Zhang, Yide Light Sci Appl News & Views A computational imaging platform utilizing a physics-incorporated, deep-learned design of binary phase filter and a jointly optimized deconvolution neural network has been reported, achieving high-resolution, high-contrast imaging over extended depth ranges without the need for serial refocusing. Nature Publishing Group UK 2023-11-24 /pmc/articles/PMC10667531/ /pubmed/37996459 http://dx.doi.org/10.1038/s41377-023-01323-y Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle News & Views
Zhang, Yide
Deep learning-enhanced microscopy with extended depth-of-field
title Deep learning-enhanced microscopy with extended depth-of-field
title_full Deep learning-enhanced microscopy with extended depth-of-field
title_fullStr Deep learning-enhanced microscopy with extended depth-of-field
title_full_unstemmed Deep learning-enhanced microscopy with extended depth-of-field
title_short Deep learning-enhanced microscopy with extended depth-of-field
title_sort deep learning-enhanced microscopy with extended depth-of-field
topic News & Views
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10667531/
https://www.ncbi.nlm.nih.gov/pubmed/37996459
http://dx.doi.org/10.1038/s41377-023-01323-y
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