The Identification of a Quantative Trait Loci-Allele System of Antixenosis against the Common Cutworm (Spodoptera litura Fabricius) at the Seedling Stage in the Chinese Soybean Landrace Population

Common cutworm (CCW) is an omnivorous insect causing severe yield losses in soybean crops. The seedling-stage mini-tray identification system with the damaged leaf percentage (DLP) as an indicator was used to evaluate antixenosis against CCW in the Chinese soybean landrace population (CSLRP) under t...

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Detalles Bibliográficos
Autores principales: Pan, Lin, Gai, Junyi, Xing, Guangnan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10671034/
https://www.ncbi.nlm.nih.gov/pubmed/38003278
http://dx.doi.org/10.3390/ijms242216089

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10671034/
https://www.ncbi.nlm.nih.gov/pubmed/38003278
http://dx.doi.org/10.3390/ijms242216089

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