An Aging Small-Signal Model for Degradation Prediction of Microwave Heterojunction Bipolar Transistor S-Parameters Based on Prior Knowledge Neural Network

In this paper, an aging small-signal model for degradation prediction of microwave heterojunction bipolar transistor (HBT) S-parameters based on prior knowledge neural networks (PKNNs) is explored. A dual-extreme learning machine (D-ELM) structure with an adaptive genetic algorithm (AGA) optimizatio...

Descripción completa

Detalles Bibliográficos
Autores principales: Cheng, Lin, Lu, Hongliang, Yan, Silu, Liu, Chen, Qiao, Jiantao, Qi, Junjun, Cheng, Wei, Zhang, Yimen, Zhang, Yuming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10673388/
https://www.ncbi.nlm.nih.gov/pubmed/38004880
http://dx.doi.org/10.3390/mi14112023

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10673388/
https://www.ncbi.nlm.nih.gov/pubmed/38004880
http://dx.doi.org/10.3390/mi14112023

Ejemplares similares