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A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
Measuring resistances at the nanoscale has attracted recent attention for developing microelectronic components, memory devices, molecular electronics, and two-dimensional materials. Despite the decisive contribution of scanning probe microscopy in imaging resistance and current variations, measurem...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10682512/ https://www.ncbi.nlm.nih.gov/pubmed/38034476 http://dx.doi.org/10.3762/bjnano.14.94 |