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A lightweight transformer for faster and robust EBSD data collection

Three dimensional electron back-scattered diffraction (EBSD) microscopy is a critical tool in many applications in materials science, yet its data quality can fluctuate greatly during the arduous collection process, particularly via serial-sectioning. Fortunately, 3D EBSD data is inherently sequenti...

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Detalles Bibliográficos
Autores principales: Dong, Harry, Donegan, Sean, Shah, Megna, Chi, Yuejie
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10692076/
https://www.ncbi.nlm.nih.gov/pubmed/38040823
http://dx.doi.org/10.1038/s41598-023-47936-6