Exciting fluctuations: monitoring competence induction dynamics at the single-cell level

Detalles Bibliográficos
Autores principales: Tsang, John, van Oudenaarden, Alexander
Formato: Texto
Lenguaje:English
Publicado: 2006
Materias:
News and Views
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC1681496/
https://www.ncbi.nlm.nih.gov/pubmed/16738573
http://dx.doi.org/10.1038/msb4100064

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC1681496/
https://www.ncbi.nlm.nih.gov/pubmed/16738573
http://dx.doi.org/10.1038/msb4100064

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