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A NEW METHOD OF POLARIZATION MICROSCOPIC ANALYSIS : I. Scanning with a Birefringence Detection System
A new method of polarized light analysis is described in which a highly sensitive electronic detector specific for birefringence is used to identify the crystalline axes of an object and then measure its phase retardation due to birefringence. The microscopic system employed in the method consists o...
| Autores principales: | , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
The Rockefeller University Press
1963
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2106293/ https://www.ncbi.nlm.nih.gov/pubmed/14079486 |