SVD-Based Evaluation of Multiplexing in Multipinhole SPECT Systems

Multipinhole SPECT system design is largely a trial-and-error process. General principles can give system designers a general idea of how a system with certain characteristics will perform. However, the specific performance of any particular system is unknown before the system is tested. The develop...

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Detalles Bibliográficos
Autores principales: Jorgensen, Aaron K., Zeng, Gengsheng L.
Formato: Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2008
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2605944/
https://www.ncbi.nlm.nih.gov/pubmed/19125178
http://dx.doi.org/10.1155/2008/769195

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2605944/
https://www.ncbi.nlm.nih.gov/pubmed/19125178
http://dx.doi.org/10.1155/2008/769195

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