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SVD-Based Evaluation of Multiplexing in Multipinhole SPECT Systems
Multipinhole SPECT system design is largely a trial-and-error process. General principles can give system designers a general idea of how a system with certain characteristics will perform. However, the specific performance of any particular system is unknown before the system is tested. The develop...
| Autores principales: | , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Hindawi Publishing Corporation
2008
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2605944/ https://www.ncbi.nlm.nih.gov/pubmed/19125178 http://dx.doi.org/10.1155/2008/769195 |