Cargando…
Introducing robustness to maximum-likelihood refinement of electron-microsopy data
An expectation-maximization algorithm for maximum-likelihood refinement of electron-microscopy images is presented that is based on fitting mixtures of multivariate t-distributions. The novel algorithm has intrinsic characteristics for providing robustness against atypical observations in the data,...
| Autores principales: | , |
|---|---|
| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2009
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2703573/ https://www.ncbi.nlm.nih.gov/pubmed/19564687 http://dx.doi.org/10.1107/S0907444909012049 |