Double mutant gating perturbation analysis predicts a high conformational stability of the domain IV S6 segment of the voltage-gated Na(+ )channel

Detalles Bibliográficos
Autores principales: Cervenka, René, Zarrabi, Touran, Lukács, Péter, König, Xaver, Hilber, Karlheinz, Todt, Hannes
Formato: Texto
Lenguaje:English
Publicado: BioMed Central 2009
Materias:
Meeting Abstract
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2778895/
http://dx.doi.org/10.1186/1471-2210-9-S2-A25

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2778895/
http://dx.doi.org/10.1186/1471-2210-9-S2-A25

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