Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads

Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging. Results: We present Pindel, a pattern growt...

Descripción completa

Detalles Bibliográficos
Autores principales: Ye, Kai, Schulz, Marcel H., Long, Quan, Apweiler, Rolf, Ning, Zemin
Formato: Texto
Lenguaje:English
Publicado: Oxford University Press 2009
Materias:
Ismb/Eccb 2009 Special Interest Group on Short Read Sequencing
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2781750/
https://www.ncbi.nlm.nih.gov/pubmed/19561018
http://dx.doi.org/10.1093/bioinformatics/btp394

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2781750/
https://www.ncbi.nlm.nih.gov/pubmed/19561018
http://dx.doi.org/10.1093/bioinformatics/btp394

Ejemplares similares