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Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads
Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging. Results: We present Pindel, a pattern growt...
| Autores principales: | , , , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Oxford University Press
2009
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2781750/ https://www.ncbi.nlm.nih.gov/pubmed/19561018 http://dx.doi.org/10.1093/bioinformatics/btp394 |