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Enhanced imaging in low dose electron microscopy using electron counting
We compare the direct electron imaging performance at 120 keV of a monolithic active pixel sensor (MAPS) operated in a conventional integrating mode with the performance obtained when operated in a single event counting mode. For the combination of sensor and incident electron energy used here, we p...
| Autores principales: | , , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2009
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2868354/ https://www.ncbi.nlm.nih.gov/pubmed/19647366 http://dx.doi.org/10.1016/j.ultramic.2009.07.004 |