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Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers

The effect of illumination on the hydrofluoric acid etching of AlAs sacrificial layers with systematically varied thicknesses in order to release and roll up InGaAs/GaAs bilayers was studied. For thicknesses of AlAs below 10 nm, there were two etching regimes for the area under illumination: one at...

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Detalles Bibliográficos
Autores principales: Costescu, Ruxandra M, Deneke, Christoph, Thurmer, Dominic J, Schmidt, Oliver G
Formato: Texto
Lenguaje:English
Publicado: Springer 2009
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2893847/
https://www.ncbi.nlm.nih.gov/pubmed/20652125
http://dx.doi.org/10.1007/s11671-009-9421-8
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author Costescu, Ruxandra M
Deneke, Christoph
Thurmer, Dominic J
Schmidt, Oliver G
author_facet Costescu, Ruxandra M
Deneke, Christoph
Thurmer, Dominic J
Schmidt, Oliver G
author_sort Costescu, Ruxandra M
collection PubMed
description The effect of illumination on the hydrofluoric acid etching of AlAs sacrificial layers with systematically varied thicknesses in order to release and roll up InGaAs/GaAs bilayers was studied. For thicknesses of AlAs below 10 nm, there were two etching regimes for the area under illumination: one at low illumination intensities, in which the etching and releasing proceeds as expected and one at higher intensities in which the etching and any releasing are completely suppressed. The “etch suppression” area is well defined by the illumination spot, a feature that can be used to create heterogeneously etched regions with a high degree of control, shown here on patterned samples. Together with the studied self-limitation effect, the technique offers a way to determine the position of rolled-up micro- and nanotubes independently from the predefined lithographic pattern.
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spelling pubmed-28938472010-07-21 Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers Costescu, Ruxandra M Deneke, Christoph Thurmer, Dominic J Schmidt, Oliver G Nanoscale Res Lett Nano Express The effect of illumination on the hydrofluoric acid etching of AlAs sacrificial layers with systematically varied thicknesses in order to release and roll up InGaAs/GaAs bilayers was studied. For thicknesses of AlAs below 10 nm, there were two etching regimes for the area under illumination: one at low illumination intensities, in which the etching and releasing proceeds as expected and one at higher intensities in which the etching and any releasing are completely suppressed. The “etch suppression” area is well defined by the illumination spot, a feature that can be used to create heterogeneously etched regions with a high degree of control, shown here on patterned samples. Together with the studied self-limitation effect, the technique offers a way to determine the position of rolled-up micro- and nanotubes independently from the predefined lithographic pattern. Springer 2009-09-03 /pmc/articles/PMC2893847/ /pubmed/20652125 http://dx.doi.org/10.1007/s11671-009-9421-8 Text en Copyright ©2009 Springer
spellingShingle Nano Express
Costescu, Ruxandra M
Deneke, Christoph
Thurmer, Dominic J
Schmidt, Oliver G
Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title_full Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title_fullStr Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title_full_unstemmed Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title_short Rolled-Up Nanotech: Illumination-Controlled Hydrofluoric Acid Etching of AlAs Sacrificial Layers
title_sort rolled-up nanotech: illumination-controlled hydrofluoric acid etching of alas sacrificial layers
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2893847/
https://www.ncbi.nlm.nih.gov/pubmed/20652125
http://dx.doi.org/10.1007/s11671-009-9421-8
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