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Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO(2)
Dynamic scaling behavior has been observed during the room-temperature growth of sputtered Au films on SiO(2)using the atomic force microscopy technique. By the analyses of the dependence of the roughness, σ, of the surface roughness power,P(f), and of the correlation length,ξ, on the film thickness...
| Autores principales: | , , , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2009
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2894129/ https://www.ncbi.nlm.nih.gov/pubmed/20596386 http://dx.doi.org/10.1007/s11671-008-9235-0 |