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Radiation dose optimized lateral expansion of the field of view in synchrotron radiation X-ray tomographic microscopy
Volumetric data at micrometer level resolution can be acquired within a few minutes using synchrotron-radiation-based tomographic microscopy. The field of view along the rotation axis of the sample can easily be increased by stacking several tomograms, allowing the investigation of long and thin obj...
| Autores principales: | , , , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2927902/ https://www.ncbi.nlm.nih.gov/pubmed/20724780 http://dx.doi.org/10.1107/S0909049510019618 |