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X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied...
| Autores principales: | , , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3025476/ https://www.ncbi.nlm.nih.gov/pubmed/20157279 http://dx.doi.org/10.1107/S0909049509052078 |