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X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe

Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied...

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Detalles Bibliográficos
Autores principales: Specht, E. D., Walker, F. J., Liu, Wenjun
Formato: Texto
Lenguaje:English
Publicado: International Union of Crystallography 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3025476/
https://www.ncbi.nlm.nih.gov/pubmed/20157279
http://dx.doi.org/10.1107/S0909049509052078
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author Specht, E. D.
Walker, F. J.
Liu, Wenjun
author_facet Specht, E. D.
Walker, F. J.
Liu, Wenjun
author_sort Specht, E. D.
collection PubMed
description Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described.
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spelling pubmed-30254762011-01-25 X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe Specht, E. D. Walker, F. J. Liu, Wenjun J Synchrotron Radiat Research Papers Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described. International Union of Crystallography 2010-01-16 /pmc/articles/PMC3025476/ /pubmed/20157279 http://dx.doi.org/10.1107/S0909049509052078 Text en © Specht, Walker and Liu 2010 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Specht, E. D.
Walker, F. J.
Liu, Wenjun
X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title_full X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title_fullStr X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title_full_unstemmed X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title_short X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
title_sort x-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline fe
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3025476/
https://www.ncbi.nlm.nih.gov/pubmed/20157279
http://dx.doi.org/10.1107/S0909049509052078
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