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X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied...
Autores principales: | , , |
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Formato: | Texto |
Lenguaje: | English |
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International Union of Crystallography
2010
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3025476/ https://www.ncbi.nlm.nih.gov/pubmed/20157279 http://dx.doi.org/10.1107/S0909049509052078 |
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author | Specht, E. D. Walker, F. J. Liu, Wenjun |
author_facet | Specht, E. D. Walker, F. J. Liu, Wenjun |
author_sort | Specht, E. D. |
collection | PubMed |
description | Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described. |
format | Text |
id | pubmed-3025476 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2010 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-30254762011-01-25 X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe Specht, E. D. Walker, F. J. Liu, Wenjun J Synchrotron Radiat Research Papers Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described. International Union of Crystallography 2010-01-16 /pmc/articles/PMC3025476/ /pubmed/20157279 http://dx.doi.org/10.1107/S0909049509052078 Text en © Specht, Walker and Liu 2010 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Specht, E. D. Walker, F. J. Liu, Wenjun X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title | X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title_full | X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title_fullStr | X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title_full_unstemmed | X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title_short | X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe |
title_sort | x-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline fe |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3025476/ https://www.ncbi.nlm.nih.gov/pubmed/20157279 http://dx.doi.org/10.1107/S0909049509052078 |
work_keys_str_mv | AT spechted xraymicrodiffractionanalysisofradiationinduceddefectsinsinglegrainsofpolycrystallinefe AT walkerfj xraymicrodiffractionanalysisofradiationinduceddefectsinsinglegrainsofpolycrystallinefe AT liuwenjun xraymicrodiffractionanalysisofradiationinduceddefectsinsinglegrainsofpolycrystallinefe |