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Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials
We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient (dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions can be performed in the intermittent contact regime in different environments. Such combination provides sensitive detect...
| Autores principales: | , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2011
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3045941/ https://www.ncbi.nlm.nih.gov/pubmed/21977411 http://dx.doi.org/10.3762/bjnano.2.2 |