Deconstructing the Late Phase of Vimentin Assembly by Total Internal Reflection Fluorescence Microscopy (TIRFM)

Quantitative imaging of intermediate filaments (IF) during the advanced phase of the assembly process is technically difficult, since the structures are several µm long and therefore they exceed the field of view of many electron (EM) or atomic force microscopy (AFM) techniques. Thereby quantitative...

Descripción completa

Detalles Bibliográficos
Autores principales: Winheim, Stefan, Hieb, Aaron R., Silbermann, Marleen, Surmann, Eva-Maria, Wedig, Tatjana, Herrmann, Harald, Langowski, Jörg, Mücke, Norbert
Formato: Texto
Lenguaje:English
Publicado: Public Library of Science 2011
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3081349/
https://www.ncbi.nlm.nih.gov/pubmed/21544245
http://dx.doi.org/10.1371/journal.pone.0019202

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3081349/
https://www.ncbi.nlm.nih.gov/pubmed/21544245
http://dx.doi.org/10.1371/journal.pone.0019202

Ejemplares similares