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Label-free optical imaging of membrane patches for atomic force microscopy
In atomic force microscopy (AFM), finding sparsely distributed regions of interest can be difficult and time-consuming. Typically, the tip is scanned until the desired object is located. This process can mechanically or chemically degrade the tip, as well as damage fragile biological samples. Protei...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Optical Society of America
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3158999/ https://www.ncbi.nlm.nih.gov/pubmed/21164738 http://dx.doi.org/10.1364/OE.18.023924 |